Based on clinical data from the first 24 hours of ICU admission, we used a two-stage feature selection process combining light gradient boosting machine (LightGBM) and Shapley additive explanation ...
Abstract: Wafer map defect pattern recognition is an indispensable component of semiconductor manufacturing, providing crucial information for identifying the root causes of defects in semiconductor ...
Abstract: This study analyzes electric vehicle (EV) charging patterns and station utilization in Tennessee using machine learning (ML) techniques. While previous research has examined time series ...
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